I-V characterization of graphene based TFTs
Sample preparation of mouse brain tissue slices by micro- dissection for electrophysiology experiments
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
Dynamic characterization of a MEMS membrane resonator by Digital Holographic Microscopy
Assisted electrical probing for fast repetitive operations on wafers
Electrical testing of LED or other electronic components.
Deformation of an AFM cantilever observed at the SEM.
4-point probe measurement on semiconductor Si nanowires.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Nanoparticles manipulation and assembly.
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Piezoresistive response analysis of CNT/SU-8 nanocomposites integrated into organic MEMS cantilevers.
Calculate the Young's modulus of a nanowire.
Nanometer precision optical fiber positioner.
Localized I-V characterization of PV cells under monochromatic illumination.