Nanoparticles manipulation and assembly.
Electrical testing of LED or other electronic components.
Deformation of an AFM cantilever observed at the SEM.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Piezoresistive response analysis of CNT/SU-8 nanocomposites integrated into organic MEMS cantilevers.
I-V characterization of graphene based TFTs
Sample preparation of mouse brain tissue slices by micro- dissection for electrophysiology experiments
Webinar presentation. Characterization of the electronic properties of nanowires in SEM.
4-point probe measurement on semiconductor Si nanowires.
Nanometer precision optical fiber positioner.
Calculate the Young's modulus of a nanowire.
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Dynamic characterization of a MEMS membrane resonator by Digital Holographic Microscopy
Semi-automatic wafer-level electrical measurements.
Localized I-V characterization of PV cells under monochromatic illumination.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).