Handling and positioning single nanowires for electrical and photoconductive characterizations.
4-point probe measurement on semiconductor Si nanowires.
Nanoparticles manipulation and assembly.
Deformation of an AFM cantilever observed at the SEM.
Electrical testing of LED or other electronic components.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
Sample preparation of mouse brain tissue slices by micro- dissection for electrophysiology experiments
Calculate the Young's modulus of a nanowire.
Nanometer precision optical fiber positioner.
Assisted electrical probing for fast repetitive operations on wafers
Piezoresistive response analysis of CNT/SU-8 nanocomposites integrated into organic MEMS cantilevers.
Dynamic characterization of a MEMS membrane resonator by Digital Holographic Microscopy
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Localized I-V characterization of PV cells under monochromatic illumination.
I-V characterization of graphene based TFTs