Calculate the Young's modulus of a nanowire.
Semi-automatic wafer-level electrical measurements.
Localized I-V characterization of PV cells under monochromatic illumination.
4-point probe measurement on semiconductor Si nanowires.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
I-V characterization of graphene based TFTs
Piezoresistive response analysis of CNT/SU-8 nanocomposites integrated into organic MEMS cantilevers.
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
Electrical testing of LED or other electronic components.
Nanoparticles manipulation and assembly.
Sample preparation of mouse brain tissue slices by micro- dissection for electrophysiology experiments
Deformation of an AFM cantilever observed at the SEM.
Nanometer precision optical fiber positioner.
Webinar presentation. Characterization of the electronic properties of nanowires in SEM.
Dynamic characterization of a MEMS membrane resonator by Digital Holographic Microscopy