Sample preparation of mouse brain tissue slices by micro- dissection for electrophysiology experiments
Deformation of an AFM cantilever observed at the SEM.
Calculate the Young's modulus of a nanowire.
I-V characterization of graphene based TFTs
4-point probe measurement on semiconductor Si nanowires.
Nanoparticles manipulation and assembly.
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
Electrical testing of LED or other electronic components.
Localized I-V characterization of PV cells under monochromatic illumination.
Piezoresistive response analysis of CNT/SU-8 nanocomposites integrated into organic MEMS cantilevers.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Nanometer precision optical fiber positioner.
Assisted electrical probing for fast repetitive operations on wafers
Dynamic characterization of a MEMS membrane resonator by Digital Holographic Microscopy