In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Nanoparticles manipulation and assembly.
Semi-automatic wafer-level electrical measurements.
Piezoresistive response analysis of CNT/SU-8 nanocomposites integrated into organic MEMS cantilevers.
Electrical testing of LED or other electronic components.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
Webinar presentation. Characterization of the electronic properties of nanowires in SEM.
Sample preparation of mouse brain tissue slices by micro- dissection for electrophysiology experiments
Dynamic characterization of a MEMS membrane resonator by Digital Holographic Microscopy
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Deformation of an AFM cantilever observed at the SEM.
Nanometer precision optical fiber positioner.
Localized I-V characterization of PV cells under monochromatic illumination.
I-V characterization of graphene based TFTs
4-point probe measurement on semiconductor Si nanowires.
Calculate the Young's modulus of a nanowire.