Nanometer precision optical fiber positioner.
Electrical testing of LED or other electronic components.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
Webinar presentation. Characterization of the electronic properties of nanowires in SEM.
Sample preparation of mouse brain tissue slices by micro- dissection for electrophysiology experiments
Calculate the Young's modulus of a nanowire.
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Nanoparticles manipulation and assembly.
I-V characterization of graphene based TFTs
Dynamic characterization of a MEMS membrane resonator by Digital Holographic Microscopy
Piezoresistive response analysis of CNT/SU-8 nanocomposites integrated into organic MEMS cantilevers.
Semi-automatic wafer-level electrical measurements.
Deformation of an AFM cantilever observed at the SEM.
Localized I-V characterization of PV cells under monochromatic illumination.
4-point probe measurement on semiconductor Si nanowires.