Deformation of an AFM cantilever observed at the SEM.
Electrical testing of LED or other electronic components.
I-V characterization of graphene based TFTs
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Nanometer precision optical fiber positioner.
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Nanoparticles manipulation and assembly.
Localized I-V characterization of PV cells under monochromatic illumination.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
Assisted electrical probing for fast repetitive operations on wafers
Calculate the Young's modulus of a nanowire.
Dynamic characterization of a MEMS membrane resonator by Digital Holographic Microscopy
Piezoresistive response analysis of CNT/SU-8 nanocomposites integrated into organic MEMS cantilevers.
4-point probe measurement on semiconductor Si nanowires.
Sample preparation of mouse brain tissue slices by micro- dissection for electrophysiology experiments