Deformation of an AFM cantilever observed at the SEM.
Semi-automatic wafer-level electrical measurements.
I-V characterization of graphene based TFTs
Nanometer precision optical fiber positioner.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
Piezoresistive response analysis of CNT/SU-8 nanocomposites integrated into MEMS cantilevers.
Characterization of the piezoelectric response of nanowires to design force sensors
Failures detection in semiconductor devices with two SEM based nanoprobing techniques.
Electrical testing of LED or other electronic components.
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Dynamic characterization of a MEMS membrane resonator by Digital Holographic Microscopy
Webinar presentation. Four-probe electrical measurements of nanowires in SEM.
Nanoparticles manipulation and assembly.
Localized I-V characterization of PV cells under monochromatic illumination.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Sample preparation of mouse brain tissue slices by micro- dissection for electrophysiology experiments