Calculate the Young's modulus of a nanowire.
Localized I-V characterization of PV cells under monochromatic illumination.
Assisted electrical probing for fast repetitive operations on wafers
Electrical testing of LED or other electronic components.
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Sample preparation of mouse brain tissue slices by micro- dissection for electrophysiology experiments
4-point probe measurement on semiconductor Si nanowires.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Nanometer precision optical fiber positioner.
Piezoresistive response analysis of CNT/SU-8 nanocomposites integrated into organic MEMS cantilevers.
Deformation of an AFM cantilever observed at the SEM.
Dynamic characterization of a MEMS membrane resonator by Digital Holographic Microscopy
Nanoparticles manipulation and assembly.
I-V characterization of graphene based TFTs
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).