I-V characterization of graphene based TFTs
Localized I-V characterization of PV cells under monochromatic illumination.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
Nanoparticles manipulation and assembly.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Dynamic characterization of a MEMS membrane resonator by Digital Holographic Microscopy
Webinar presentation. Four-probe electrical measurements of nanowires in SEM.
Nanometer precision optical fiber positioner.
Characterization of the piezoelectric response of nanowires to design force sensors
Sample preparation of mouse brain tissue slices by micro- dissection for electrophysiology experiments
Semi-automatic wafer-level electrical measurements.
Deformation of an AFM cantilever observed at the SEM.
Failures detection in semiconductor devices with two SEM based nanoprobing techniques.
Piezoresistive response analysis of CNT/SU-8 nanocomposites integrated into MEMS cantilevers.
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Electrical testing of LED or other electronic components.