Characterization of the piezoelectric response of nanowires to design force sensors
Nanoparticles manipulation and assembly.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
Deformation of an AFM cantilever observed at the SEM.
Semi-automatic wafer-level electrical measurements.
Dynamic characterization of a MEMS membrane resonator by Digital Holographic Microscopy
Failures detection in semiconductor devices with two SEM based nanoprobing techniques.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Sample preparation of mouse brain tissue slices by micro- dissection for electrophysiology experiments
Webinar presentation. Four-probe electrical measurements of nanowires in SEM.
Localized I-V characterization of PV cells under monochromatic illumination.
I-V characterization of graphene based TFTs
Nanometer precision optical fiber positioner.
Piezoresistive response analysis of CNT/SU-8 nanocomposites integrated into MEMS cantilevers.
Electrical testing of LED or other electronic components.