Localized I-V characterization of PV cells under monochromatic illumination.
Characterization of the piezoelectric response of nanowires to design force sensors
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Webinar presentation. Four-probe electrical measurements of nanowires in SEM.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Electrical testing of LED or other electronic components.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
I-V characterization of graphene based TFTs
Piezoresistive response analysis of CNT/SU-8 nanocomposites integrated into MEMS cantilevers.
Sample preparation of mouse brain tissue slices by micro- dissection for electrophysiology experiments
Semi-automatic wafer-level electrical measurements.
Failures detection in semiconductor devices with two SEM based nanoprobing techniques.
Dynamic characterization of a MEMS membrane resonator by Digital Holographic Microscopy
Nanometer precision optical fiber positioner.
Nanoparticles manipulation and assembly.
Deformation of an AFM cantilever observed at the SEM.