Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
Localized I-V characterization of PV cells under monochromatic illumination.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Sample preparation of mouse brain tissue slices by micro- dissection for electrophysiology experiments
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Piezoresistive response analysis of CNT/SU-8 nanocomposites integrated into MEMS cantilevers.
I-V characterization of graphene based TFTs
Nanoparticles manipulation and assembly.
Webinar presentation. Four-probe electrical measurements of nanowires in SEM.
Semi-automatic wafer-level electrical measurements.
Failures detection in semiconductor devices with two SEM based nanoprobing techniques.
Nanometer precision optical fiber positioner.
Deformation of an AFM cantilever observed at the SEM.
Electrical testing of LED or other electronic components.
Dynamic characterization of a MEMS membrane resonator by Digital Holographic Microscopy
Characterization of the piezoelectric response of nanowires to design force sensors