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Electrical Probing Option

To perform charge transport measurements to characterize the electrical conductivity of novel materials or to carry out tests for IC failure analysis, the probe moved by the miBot nanomanipulator must be connected to an external electronic instrument (oscilloscope, power source, etc.)

An oscilloscope connected to the miBase

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Technical Specifications

Probing voltage range
± 100 V

Probing current
< 100 mA

Probing signal resistance
typ. 3.5 Ohms

Examples of use

Single cell manipulation
Wafer probing
Bending of Nanowires
Micro-Dissection of Brain Slices
AFM Probe Tip Decoration
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