Imina Technologies is pleased to organize a users meeting at the Fraunhofer Institute IMWS for Microstructure of Materials and Systems.
|10:00 am||Welcome address|
|10:20 am||Mr. Jörg Jatzkowski, Fraunhofer IMWS-CAM, Germany|
|Title: Application of nano-probing and combined current imaging techniques for integrated circuits|
|10:45 am||Live demonstration of Imina Technologies' systems|
|11:00 am||Workshop with hands-on experiments on users samples (please register to bring yours)|
Details on the exact location of the users meeting will be communicated to the participants a week before.
Mr. Jatzkowski is part of the Center for Applied Microstructure Diagnostics CAM of Fraunhofer Institute IMWS in Halle, Germany. Here is what he says about Imina Technologies' products:
Because it's very intuitive to move a probe over several millimeters and position it with nanometer resolution on the target, we can now load several devices to test side by side in the SEM and process them successively, without having to open the chamber between two. Besides this, the compactness of the miBots and its low dissipation power result in extremely small temperature drifts at the probe tips and, as a direct consequence, to very stable electrical measurements.