This application note introduce the use of the miBot nanomanipulators to carry out failure analysis of semiconductor inside the SEM. The Electron Beam Induced Current (EBIC) technique is typically used to investigate p-n junctions and locate faulty ones.
This application note describes a method and the preliminary results that were obtained by CEA Leti in Grenoble, France while attempting to characterize the electrical response measured from bending individual GaN nanowires. The piezoelectric effect of these particles make them interesting candidates to create high sensitive and ultra-resolved microsensors that have application in force and pressure sensing.
Congratulation to Emil Stokkeland for his image that won the annual image contest from NTNU NanoLab! This image shows a silver coated polymer sphere with a diameter of 30 µm and a 150 nm silver coating, whose electric properties are being investigated by a four wire measurement. The probes are placed with the assistance of Imina Technologies’ miBot micromanipulators.
The video recorded during our webinar session of September 24, 2014 is now available online. In this presentation, Prof. Antonius van Helvoort at NTNU Trondheim in Norway speaks about the challenges he and his team encounter to characterize the electronic properties of III-V semiconducting nanowires inside the SEM.
Imina Technologies unveiled at SEMICON Europa 2014 its latest integration for electrical measurements at the wafer-level. This unique solution provides both flexibility and automation capabilities to achieve fast and reliable testing of ICs and MEMS.
For the 4th time in a row, we are very proud to announce that Imina Technologies has been ranked in the TOP 100 of the best Swiss startups. The selection is made by a panel of 100 experts to elect, among several hundreds of startups, the most promising and established companies.
Benoît Dagon, CEO of Imina Technologies, talks to Will Soutters from AZoNano.com about the miBot nanomanipulator and our solutions for sample characterization under electron and light microscopes, in their latest Insights from Industry interview.
To celebrate Imina Technologies 5th anniversary together, you are invited to our first webinar where we will be honored to welcome two keynote speakers, Prof. Urs Staufer (TU Delft) and Prof. Ton van Helvoort (NTNU Trondheim). They will talk about their research on graphene and nanowires and the challenges they encounter in handling and characterizing these materials.
This application note reports about the electromechanical characterization of the enhanced sensitivity of organic piezoresistive microcantilevers developed at the IMS Laboratory of the Université de Bordeaux, France. Together with their electrical probing capabilities, the sub-micron...