Lausanne, Switzerland, May 25, 2016 -- Imina Technologies SA announces today the successful installation of the new load-lock compatible Nanoprobing SEM Solution (PL16-4B-V) at the University of Rennes-1, France. The system has been installed in a JEOL JSM-7100F scanning electron microscope at the shared microscope facility C.M.E.B.A. / ScanMAT.
We are thrilled to announce that the semiconductor manufacturer STMicroelectronics has chosen Imina Technologies' probers to expand their failure analysis investigation capabilities. In the past three years, to respond to the growing interest of the semiconductor industry in our probing systems, we have indeed focused our developments on...
In this video, Barium Titanate (BaTiO3) microparticles with a diameter between 10 and 30 µm are picked and moved to destination with a micro-gripper. An additional miBot™ equipped with a probe is also used to unstick the microparticle from the gripper and to position it on the substrate. This combination of using a microgripper and a probe allows the operator to quickly transfer microspheres over long distances and precisely position them at destination with micrometer precision.
This application note reports on the work that is carried out at the Hamlyn Center for Robotic Surgery of Imperial College London and aims at tackling these challenges. A multi-robots system was developed. It takes advantage of the high motion smoothness of Imina Technologies’s mobile micro-robots as well as their flexibility to easily adjust the position and orientation of the end-effector to various sample shapes and dimensions.
This application note reports on the characterization of PMOS field-effect transistors inside the SEM by means of nanoprobers. Imina Technologies Nanoprobing SEM solution loaded with four miBot™ nanomanipulators enables the investigator to precisely put down probes directly on metal lines. Electrical measurements are performed with a Keithley 4200-SCS semiconductor parameter analyzer.
The research on micro/nano scale robotics performed at the Hamlyn Center for Robotic Surgery of Imperial College London was highlighted in a recent article of The Guardian entitled: The innovators: nanoscale devices making big strides in surgery. The development of healthcare technologies is based on the use of a new types of micro tools installed on Imina Technologies’ high precision robots.
This application note introduce the use of the miBot nanomanipulators to carry out failure analysis of semiconductor inside the SEM. The Electron Beam Induced Current (EBIC) technique is typically used to investigate p-n junctions and locate faulty ones.
This application note describes a method and the preliminary results that were obtained by CEA Leti in Grenoble, France while attempting to characterize the electrical response measured from bending individual GaN nanowires. The piezoelectric effect of these particles make them interesting candidates to create high sensitive and ultra-resolved microsensors that have application in force and pressure sensing.
Congratulation to Emil Stokkeland for his image that won the annual image contest from NTNU NanoLab! This image shows a silver coated polymer sphere with a diameter of 30 µm and a 150 nm silver coating, whose electric properties are being investigated by a four wire measurement. The probes are placed with the assistance of Imina Technologies’ miBot micromanipulators.
The video recorded during our webinar session of September 24, 2014 is now available online. In this presentation, Prof. Antonius van Helvoort at NTNU Trondheim in Norway speaks about the challenges he and his team encounter to characterize the electronic properties of III-V semiconducting nanowires inside the SEM.