Benoît Dagon, CEO of Imina Technologies, talks to Will Soutters from AZoNano.com about the miBot nanomanipulator and our solutions for sample characterization under electron and light microscopes, in their latest Insights from Industry interview.
This application note reports about the electromechanical characterization of the enhanced sensitivity of organic piezoresistive microcantilevers developed at the IMS Laboratory of the Université de Bordeaux, France. Together with their electrical probing capabilities, the sub-micron positioning resolution and the high mechanical stability of the miBot micromanipulators were exploited to carry out the characterization procedure of these systems. Results of that experiment were published in the March issue of Sensors and Actuators. Read more
Imina Technologies is pleased to announce the organization of the contest “Win a Swiss Watch” at booth # A32 during the exhibition of scientific instruments that will take place during the Deutsche Physikalische Gesellschaft Spring Meeting 2014 in Dresden, Germany.
This application note reports on the use of Imina Technologies miBot manipulators by scientists at the Laboratoire de Nanotechnologie et d’Instrumentation Optique of Université de Technologie de Troyes to carry out the delicate operation that consists in positioning single ZnO nanowires grown by metalorganic chemical vapour deposition (MOCVD) at specific locations on the substrate in order to be able characterize their photoconductive properties. Results of that experiment were published in the special issue of physica status solidi (c). Read more
Localized characterization of photovoltaic materials is a critical part in the research of novel solar cells since the PV properties can be affected at small scales. This application note reports on using Imina Technologies miBots to precisely bring laser light coupled in an optical fiber above the sample surface and electrical probes to contact the device. Typical characteristics of the sample are measured with an Agilent/HP 4156A semiconductor analyzer. Read more
Landing probes on thin electrodes without penetrating them is key in electrical characterization of thin-film transistors (TFT). Otherwise, this would result in improper characterization and damage of the device. This application note reports on how EPFL scientists overcame that issue by using miBot micromanipulators as high precision probers to characterize a TFT with a graphene channel and 100 nm thick conductive electrodes. Read more
Imina Technologies would like to congratulate the team of Prof. Anna Fontcuberta i Morral at the Laboratory of Semiconductor Materials at EPFL for their work on GaAs nanowires that could help significantly improving the efficiency of solar cells.