Dynamic characterization of a MEMS membrane resonator by Digital Holographic Microscopy
Semi-automatic wafer-level electrical measurements.
Piezoresistive response analysis of CNT/SU-8 nanocomposites integrated into MEMS cantilevers.
Localized I-V characterization of PV cells under monochromatic illumination.
Electrical testing of LED or other electronic components.
Nanometer precision optical fiber positioner.
I-V characterization of graphene based TFTs
Characterization of the piezoelectric response of nanowires to design force sensors
Sample preparation of mouse brain tissue slices by micro- dissection for electrophysiology experiments