Pick and place. Micro-gripper for micron scale objects manipulation.
Computer assisted micro object manipulation.
Characterization of the piezoelectric response of nanowires for the design of force sensors
Semi-automatic wafer-level electrical measurements.
Piezoresistive response analysis of CNT/SU-8 nanocomposites integrated into MEMS cantilevers.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Localized I-V characterization of PV cells under monochromatic illumination.
I-V characterization of graphene based TFTs
Electrical testing of LED or other electronic components.
Nanometer precision optical fiber positioner.
Sample preparation of mouse brain tissue slices by micro- dissection for electrophysiology experiments
Dynamic characterization of a MEMS membrane resonator by Digital Holographic Microscopy