I-V characterization of graphene based TFTs
Nanometer precision optical fiber positioner.
Piezoresistive response analysis of CNT/SU-8 nanocomposites integrated into organic MEMS cantilevers.
Localized I-V characterization of PV cells under monochromatic illumination.
Semi-automatic wafer-level electrical measurements.
Electrical testing of LED or other electronic components.
Sample preparation of mouse brain tissue slices by micro- dissection for electrophysiology experiments
Dynamic characterization of a MEMS membrane resonator by Digital Holographic Microscopy