Calculate the Young's modulus of a nanowire.
Deformation of an AFM cantilever observed at the SEM.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
4-point probe measurement on semiconductor Si nanowires.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Nanoparticles manipulation and assembly.
Webinar presentation. Characterization of the electronic properties of nanowires in SEM.