Calculate the Young's modulus of a nanowire.
4-point probe measurement on semiconductor Si nanowires.
Nanoparticles manipulation and assembly.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Deformation of an AFM cantilever observed at the SEM.