Theory and practice behind picking, handling and positioning nanoparticles in the SEM.
Measurement of transistor characteristics with SEM nanoprobing technique.
Failures detection in semiconductor devices with two SEM based nanoprobing techniques.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
Webinar presentation. Four-probe electrical measurements of nanowires in SEM.
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Deformation of an AFM cantilever observed at the SEM.