4-point probe measurement on semiconductor Si nanowires.
Deformation of an AFM cantilever observed at the SEM.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Calculate the Young's modulus of a nanowire.
Nanoparticles manipulation and assembly.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator