In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Nanoparticles manipulation and assembly.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
4-point probe measurement on semiconductor Si nanowires.
Deformation of an AFM cantilever observed at the SEM.
Calculate the Young's modulus of a nanowire.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Webinar presentation. Characterization of the electronic properties of nanowires in SEM.