Electron Microscopy (SEM/FIB)

Imina Technologies nanomanipulation platforms are compatible with a wide range of scanning electron microscope vacuum chambers. In situ electrical and mechanical characterization of new materials is made easy by using several miBot nanomanipulators with different probes and sensors. Learn more about our turnkey solutions.

MEMS / NEMS Testing

Electronics

Deformation of an AFM cantilever observed at the SEM.

4-Point Probing

Electronics

4-point probe measurement on semiconductor Si nanowires.

TEM Sample Preparation

Materials Science

Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).

AFM Probe Tip Decoration

Materials Science

Nanoparticles manipulation and assembly.

Nanowires Manipulation

Materials Science

in situ characterization of nanowires inside a SEM.

Bending of Nanowires

Materials Science

Calculate the Young's modulus of a nanowire.