Deformation of an AFM cantilever observed at the SEM.
Failures detection in semiconductor devices with two SEM based nanoprobing techniques.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
Webinar presentation. Four-probe electrical measurements of nanowires in SEM.
Nanoparticles manipulation and assembly.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator