Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
Handling and positioning single nanowires for electrical and photoconductive characterizations.
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Webinar presentation. Four-probe electrical measurements of nanowires in SEM.
Deformation of an AFM cantilever observed at the SEM.
Nanoparticles manipulation and assembly.
Failures detection in semiconductor devices with two SEM based nanoprobing techniques.