4-point probe measurement on semiconductor Si nanowires.
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Deformation of an AFM cantilever observed at the SEM.
Nanoparticles manipulation and assembly.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Calculate the Young's modulus of a nanowire.
Webinar presentation. Characterization of the electronic properties of nanowires in SEM.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).