Webinar presentation. Characterization of the electronic properties of nanowires in SEM.
4-point probe measurement on semiconductor Si nanowires.
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Deformation of an AFM cantilever observed at the SEM.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).
Calculate the Young's modulus of a nanowire.
Nanoparticles manipulation and assembly.