Failures detection in semiconductor devices with two SEM based nanoprobing techniques.
Deformation of an AFM cantilever observed at the SEM.
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Webinar presentation. Four-probe electrical measurements of nanowires in SEM.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Nanoparticles manipulation and assembly.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).