Nanoparticles manipulation and assembly.
In situ SEM characterization of the fracture strength of a single-crystal silicon nanowire resonator
Deformation of an AFM cantilever observed at the SEM.
4-point probe measurement on semiconductor Si nanowires.
Calculate the Young's modulus of a nanowire.
Handling and positioning single nanowires for electrical and photoconductive characterizations.
Webinar presentation. Characterization of the electronic properties of nanowires in SEM.
Deposition of an 80 nm nanowire on TEM grid inside a Scanning Electron Microscope (SEM).